Process Spectrometer
Versa PS2000 |
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The process spectrometer Versa PS2000 (download datasheet) was developed for online transmission measurements of optical layers during production. It can be used for other tasks too, e.g. spectral transmission measurements of liquids or reflexion measurements during coating processes.
The firmware of Versa PS2000 allows to preprocess the measuring data. So it is possible to calculate process specific data such as reflectivity or layer thickness.
Versa PS2000 will also be available with an internal light source (halogen lamp or xenon flash lamp) or as a NIR version.
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Advantages
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Applications
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Description
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Interfaces
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Specifications
Optical Parameters | |
Spectral range | 200 nm .. 1000 nm (Versa PS2000 NIR 900 nm … 1690 nm) |
Spectrometer |
flat field holographic grating, aberration correction mirror |
Optical bandwidth |
≤ 4.0 nm FWHM (100 µm slit) ≤ 2.5 nm FWHM (50 µm slit) ≤ 2.0 nm FWHM (30 µm slit) |
Asymmetry factor |
≥ 0.7 |
Optical input |
F-SMA 905 connector for 200 µm fiber |
Wavelength accuracy |
≤ 0.2 nm (HgAr linesource) |
Wavelength reproducibility |
≤ 0.02 nm (HgAr linesource) |
Stray light |
≤ 0.2 % (ASTM E387, GG495, λ = 420 nm/ 600 nm) |
Dynamics |
depends on detector |
Detector | 25 mm BTCCD, CMOS, NMOS* |
Electronical parameters | |
Digital resolution | 16 bit |
AD-noise |
2 counts RMS |
Sampling speed | up to 4 MS/ s |
Transfer speed |
up to 40 Mb/ s (via High Speed USB) |
Integration time | 0.01 ... 64999 ms |
Trigger delay |
10 µs |
Jitter |
≤ 2 µs |
Interfaces |
USB Ethernet or RS 422/ 485 RS 232 |
Power supply |
110 ... 220 V or PoE (if Ethernet is used) |
Mechanical parametrs |
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Dimensions (total) |
25 cm x 25 cm x 15 cm |
Weight |
3 kg |
Scope of delivery |
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Basic unit, PC software JETI VersaSpec, JETI SDK, power supply cable, operation manual |
* others on request |